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McBain Z-NIR Near Infrared Inspection Microscope

Semi-automatic Measuring and Alignment System

 

The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.

 

See also the fully-automated version of this tool.

 

Key Features