McBain Top Menu
McBain Systems

Microscopy Systems

Metrology Systems

Semiconductor systems

Custom Applications

Service and Support

McBain DDR200 and DDR300 Metrology Microscopes

200mm and 300mm Defect Detection and Review Systems


The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required. They can be used as dedicated production tools or as versatile process development tools.


Key Features