McBain Top Menu
 
McBain Systems

Microscopy Systems

Metrology Systems

Semiconductor systems

Custom Applications

Service and Support

Leica FS4000

Comparison microscope system for specimens

 

The Leica FS4000 combines the latest optomechanical knowledge of light microscopy with unequalled user-friendliness and ergonomics in an integrated solution, allowing the user to concentrate on the work at hand for highly precise and efficient results. The Leica FS4000 enables high-precision comparison of two objects at magnifications up to 1500x, supplying reliable evidence of the tiniest differences in their microstructure, texture, and color. All the usual contrasting techniques such as brightfield, fluorescence, and polarization are provided and can be selected in a fraction of a second. Various imaging modes (split image, superimposed image, and combined image) can be set at the press of a button.

 

Key Features