McBain Top Menu
McBain Systems

Microscopy Systems

Metrology Systems

Semiconductor systems

Custom Applications

Service and Support

Leica DM ILM

Inverted routine microscope for materials testing


The Leica DM ILM inverted microscope was specially designed for all inspection and measurement tasks in metallography and industrial materials testing. High-performance Leica HCS optics (Harmonic Component System) guarantee optimal conditions—maximum image resolution and perfect image contrast in incident light, brightfield, polarization contrast, plus fluorescence. And, enhanced ergonomic features ensure all inspection and measurement tasks can be performed quickly and efficiently.


Key Features